D.V. Yakimchuk, V.D. Bundyukova, D.I. Tishkevich, A.V. Trukhanov (Cryogenic Research Division, Scientific-Practical Materials Research Centre 220072 Minsk, Belarus), Jon Ustarroz, Herman Terryn, Kitty Baert (Vrije Universiteit Brussel, Belgium), A.L. Kozlovskiy, M.V. Zdorovets (Institute of Nuclear Physics, Nur-Sultan, Kazakhstan), S.A. Khubezhov (ITMO University, St. Petersburg, Russia), L.V. Panina, E. Yu. Kaniukov (MISiS, Moscow, Russia), V. Sivakov (Leibniz Institute of Photonic Technology, Jena, Germany

КАРС микроспектрометр, ЛНФ swift heavy ions-track technology scanning electron microscope X-ray diffraction analysis