Wenk H.-R., Devoe M. (UC Berkeley, USA); Huang J. (UC Berkeley, USA; Institute of Disaster Prevention, China); Gomez-Barreiro J., Barrios-Sanchez S. (University of Salamanca, Spain); Ren Y. (Argonne National Laboratory, USA; City University of Hong Kong, Hong Kong)

11-ID-C (APS, Argonne National Laboratory, USA), Zeiss-EVO SEM (UC Berkeley, USA)