Departments
X-Ray Structural Analysis of N-Si, Irradiated with Alpha Particles
- Department: DNP (ОЯФ)
- Author: Doroshkevich/Дорошкевич A. S.
- Year: 2022
- REFERENCES: Utamuradova Sh.B., Stanchik A.V., Rakhmanov D.A., Doroshkevich A.S.. Fayzullaev K.M. X-RAY STRUCTURAL ANALYSIS OF n-Si, IRRADIATED WITH ALPHA PARTICLES // New Materials, Compounds and Applications Vol.6, No.3, 2022, pp.214-219
Sh.B. Utamuradova, D.A. Rakhmanov, K.M. Fayzullaev, (Institute of Semiconductor Physics and Microelectronics, National University of Uzbekistan, Tashkent, Uzbekistan); A. V. Stanchik (Scientific-Practical Materials Research Centre NAS of Belarus, Minsk, Belarus)