Departments
Evaluation of fullerenes C60/C70 layers in polystyrene thin films by neutron and X-ray reflectometry
- Department: DNICM (НЭОНИКС)
- Author: Aksenov/Аксёнов V. L., Gapon/Гапон I. V., Gorshkova/Горшкова Y. E., Kosiachkin/Косячкин Y. N., Tropin/Тропин T. V.
- Year: 2021
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DOI:
https://doi.org/10.1080/1536383X.2021.1901276
- REFERENCES: Volume 184, February 2021, 109934
M.L. Karpets (Institute of Experimental Physics, Kosice, Slovakia)
GRAINS, IBR-2; X-ray reflectometry (FLNP); AFM (FLNP);