Department: DNICM (НЭОНИКС)
Year: 2020
DOI: DOI https://doi.org/10.1016/j.matlet.2020.128069
REFERENCES: Materials Letters. 2020. V. 275. 128069

Sun L.Y., Golovin I.S. (National University of Science and Technology “MISIS”, Russia); Cifre J. (Universitat de les Illes Balears, Spain)

YuMO, Panalytical Empyrean X-Ray diffractometer (FLNP JINR, Dubna, Russia), Perkin Elmer DSC7 (MISIS, Moscow, Russia)