Departments - DNICM (НЭОНИКС) - X-ray reflectometry for comparison of structural organization of fullerenes C60/C70 in polystyrene thin films

Department: DNICM (НЭОНИКС)

Author: Aksenov/Аксёнов V. L., Kosiachkin/Косячкин Y. N., Tropin/Тропин T. V.

Year: 2021

DOI:

DOI

https://doi.org/10.1134/S1027451021040224

REFERENCES: Journal of Surface Investigation 15(4) (2021) 768-772

Karpets M.L. (Institute of Experimental Physics, Kosice, Slovakia)

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