Department: DNP (ОЯФ)
Year: 2020
DOI: DOI https://doi.org/10.1134/S1027451020070496
REFERENCES: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2020. Vol. 14, Suppl. 1, pp. S235–S241.

T. Vasilenko,A. Kirillov, A.

JINR