Departments
Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence
- Department: SNSCM (СНИиКЗ)
- Author: Bulavin/Булавин M. V., Galushko/Галушко A. M., Mukhametuly/Мухаметулы B., Myrzabekova/Мырзабекова E., Yskakov/Ыскаков A.
- Year: 2025
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DOI:
10.3390/electronics14193802
Vasil’evskii; Klochkov; Nekrasov; Vinichenko; Kargin; Bekbayev; Shegebayev; Kulikbayeva; Nurulin; Baitugulov