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  • Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation

Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation

Department: DNP (ОЯФ)
Year: 2020
DOI: DOI https://doi.org/10.1016/j.surfcoat.2020.125494
REFERENCES: Surface & Coatings Technology PII: S0257-8972(20)30163-8

D. Kolodynska, Chemical Department, Maria Curie-Sklodowska University, pl. M. Curie-Sklodowskiej 2, 20- 031, Lublin, Poland, L.H. Khiem, Graduate University of Science and Technology, Vietnam Academy of Science and Technology, 18 Hoang Quoc Viet, Cau Giay, Ha Noi, Viet Nam, J. zuk, Institute of Physics, Maria Curie-Sklodowska University, pl. M. Curie-Sklodowskiej 1, 20-031 Lublin, Poland, M. Turek, Institute of Physics, Maria Curie-Sklodowska University, pl. M. Curie-Sklodowskiej 1, 20-031 Lublin, Poland

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