Authors

Tuan/Туан P. L.


Publication by same author

Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation

Year: 2020
Department:

Investigations of chemical and atomic composition of native oxide layers covering SIGaAs implanted with Xe ions

Year: 2020
Department:

Pseudo-dielectric function spectra of the near surface layer of GaAs implanted with various fluence of Xe+ ions

Year: 2022
Department:

Mechanism of formation water molecules and chemical bonds in Leptothrix materials

Year: 2024
Department:

An examination on the porosity of ErF3 doped CaF2 crystal using the Rutherford back-scattering method

Year: 2024
Department:

Studying the influence of proton irradiation on the distribution profile of Pt and Cr in surface layers n-Si?Pt?, n-Si?Сr? using ellipsometric spectroscopy

Year: 2024
Department: