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Tuan/Туан P. L.
Tuan/Туан P. L.
Publication by same author
Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation
by
Kulik/Кулик M.
,
Phuc/Фук T. V.
,
Tuan/Туан P. L.
Year: 2020
Department:
Investigations of chemical and atomic composition of native oxide layers covering SIGaAs implanted with Xe ions
by
Kulik/Кулик M.
,
Nowicka-Scheibe/Новицка-Шайбе J.
,
Phuc/Фук T. V.
,
Tuan/Туан P. L.
Year: 2020
Department:
Pseudo-dielectric function spectra of the near surface layer of GaAs implanted with various fluence of Xe+ ions
by
Bao My/ Бао Ми N. T.
,
Doroshkevich/Дорошкевич A. S.
,
Kulik/Кулик M.
,
Madadzada/Мададзада A. I.
,
Phuc/Фук T. V.
,
Tuan/Туан P. L.
,
Zelenyak/Зеленяк T. Y.
Year: 2022
Department:
Mechanism of formation water molecules and chemical bonds in Leptothrix materials
by
Doroshkevich/Дорошкевич A. S.
,
Hasanov/Хасанов K.M.
,
Maletskii/Малецкий A.V.
,
Tuan/Туан P. L.
Year: 2024
Department:
An examination on the porosity of ErF3 doped CaF2 crystal using the Rutherford back-scattering method
by
Cong/Конг V. D.
,
Doroshkevich/Дорошкевич A. S.
,
Khiem/Хием Le Hong
,
Nguyen/Нгуен T. B. M.
,
Tuan/Туан P. L.
,
Zelenyak/Зеленяк T. Y.
Year: 2024
Department:
Studying the influence of proton irradiation on the distribution profile of Pt and Cr in surface layers n-Si?Pt?, n-Si?Сr? using ellipsometric spectroscopy
by
Doroshkevich/Дорошкевич A. S.
,
Isaev/Исаев R. S.
,
Tuan/Туан P. L.
Year: 2024
Department:
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