Authors

Kulik/Кулик M.


Publication by same author

Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation

Year: 2020
Department:

Investigations of chemical and atomic composition of native oxide layers covering SIGaAs implanted with Xe ions

Year: 2020
Department:

Применение метода спектрометрии резерфордовского обратного рассеяния ионов в порошковых нанотехнологиях

Year: 2020
Department:

Influence of hafnium oxide on the structure and properties of powders and ceramics of the YSZ–HfO2 composition

Year: 2020
Department:

ЭЛЕКТРОСТАТИЧЕСКИЙ УСКОРИТЕЛЬ ЭГ-5 В СОВРЕМЕННЫХ НАУЧНЫХ ИССЛЕДОВАНИЯХ

Year: 2021
Department:

Pseudo-dielectric function spectra of the near surface layer of GaAs implanted with various fluence of Xe+ ions

Year: 2022
Department: