Authors

Phuc/Фук T. V.


Publication by same author

Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation

Year: 2020
Department:

Investigations of chemical and atomic composition of native oxide layers covering SIGaAs implanted with Xe ions

Year: 2020
Department:

ЭЛЕКТРОСТАТИЧЕСКИЙ УСКОРИТЕЛЬ ЭГ-5 В СОВРЕМЕННЫХ НАУЧНЫХ ИССЛЕДОВАНИЯХ

Year: 2021
Department:

Pseudo-dielectric function spectra of the near surface layer of GaAs implanted with various fluence of Xe+ ions

Year: 2022
Department: